New erase scheme for DINOR flash memory enhancing erase/write cycling endurance characteristics.

Details

Language :

English

ISBNs :

9780780321113

Database :

Complementary Index

Journal :

Proceedings of 1994 IEEE International Electron Devices Meeting

Publication Type :

Conference

Accession number :

92268690

Full Text :

https://doi.org/10.1109/IEDM.1994.383468