A probabilistic measurement for totally self-checking circuits.

Authors :: Lo, J.-C.
Fujiwara, E.
Source :: Proceedings of 1993 IEEE International Workshop on Defect & Fault Tolerance in VLSI Systems; 1993, p263-270, 8p
Publication Year :: 1993

Language :: English
ISBNs :: 9780818635021
Database :: Complementary Index
Journal :: Proceedings of 1993 IEEE International Workshop on Defect & Fault Tolerance in VLSI Systems
Publication Type :: Conference
Accession number :: 92260844
Full Text :: https://doi.org/10.1109/DFTVS.1993.595821