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Reduction of fault detection costs through testable design of sequential architectures with signal feedbacks.
- Source :
- Proceedings of 1993 IEEE International Workshop on Defect & Fault Tolerance in VLSI Systems; 1993, p223-230, 8p
- Publication Year :
- 1993
Details
- Language :
- English
- ISBNs :
- 9780818635021
- Database :
- Complementary Index
- Journal :
- Proceedings of 1993 IEEE International Workshop on Defect & Fault Tolerance in VLSI Systems
- Publication Type :
- Conference
- Accession number :
- 92260839
- Full Text :
- https://doi.org/10.1109/DFTVS.1993.595805