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The effects of floating body operation on hot carrier behavior in SOS MOSFETs.

Authors :
Chao, E.Y.
Quon, D.S.
Her, T.D.
Li, G.P.
White, J.
Liu, P.
Kjar, R.
Source :
Proceedings of 1993 IEEE International SOI Conference; 1993, p72-73, 2p
Publication Year :
1993

Details

Language :
English
ISBNs :
9780780313460
Database :
Complementary Index
Journal :
Proceedings of 1993 IEEE International SOI Conference
Publication Type :
Conference
Accession number :
92260742
Full Text :
https://doi.org/10.1109/SOI.1993.344586