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A functional test planning system for validation of DSP circuits modeled in VHDL.

Authors :
Lin, M.-W.
Armstrong, J.R.
Frank, G.A.
Concha, L.
Source :
Proceedings International Verilog HDL Conference & VHDL International Users Forum; 1998, p172-177, 6p
Publication Year :
1998

Details

Language :
English
ISBNs :
9780818684159
Database :
Complementary Index
Journal :
Proceedings International Verilog HDL Conference & VHDL International Users Forum
Publication Type :
Conference
Accession number :
92251621
Full Text :
https://doi.org/10.1109/IVC.1998.660698