New DFT techniques of non-scan sequential circuits with complete fault efficiency.

Details

Language :

English

ISBNs :

9780769503158

Database :

Complementary Index

Journal :

Proceedings Eighth Asian Test Symposium (ATS'99)

Publication Type :

Conference

Accession number :

92235596

Full Text :

https://doi.org/10.1109/ATS.1999.810761