Self-checking and fault tolerant approaches can help BIST fault coverage: a case study.

Details

Language :

English

ISBNs :

9780818674242

Database :

Complementary Index

Journal :

Proceedings ED&TC European Design & Test Conference

Publication Type :

Conference

Accession number :

92235231

Full Text :

https://doi.org/10.1109/EDTC.1996.494374