Clustering based identification of faulty ICs using I/sub DDQ/ tests.

Authors :: Jandhyala, S.
Balachandran, H.
Menon, S.
Jayasumana, A.
Source :: Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat No98EX232); 1998, p48-52, 5p
Publication Year :: 1998

Language :: English
ISBNs :: 9780818691911
Database :: Complementary Index
Journal :: Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat No98EX232)
Publication Type :: Conference
Accession number :: 92226227
Full Text :: https://doi.org/10.1109/IDDQ.1998.730756