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Reducing fault sensitivity of microprocessor-based systems by modifying workload structure.

Authors :
Audet, D.
Masson, S.
Savaria, Y.
Source :
Proceedings 1998 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems (Cat No98EX223); 1998, p241-249, 9p
Publication Year :
1998

Details

Language :
English
ISBNs :
9780818688324
Database :
Complementary Index
Journal :
Proceedings 1998 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems (Cat No98EX223)
Publication Type :
Conference
Accession number :
92225712
Full Text :
https://doi.org/10.1109/DFTVS.1998.732172