A modular scan-based testability system.

Authors :: Brglez, F.
Bryan, D.
Calhoun, J.
Lisanke, R.
Source :: Proceedings 1988 IEEE International Conference on Computer Design: VLSI; 1988, p408-412, 5p
Publication Year :: 1988

Language :: English
ISBNs :: 9780818608728
Database :: Complementary Index
Journal :: Proceedings 1988 IEEE International Conference on Computer Design: VLSI
Publication Type :: Conference
Accession number :: 92214787
Full Text :: https://doi.org/10.1109/ICCD.1988.25733