A multi-mode scannable memory element for high test application efficiency and delay testing.

Details

Language :

English

ISBNs :

9780818684364

Database :

Complementary Index

Journal :

Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231)

Publication Type :

Conference

Accession number :

92213420

Full Text :

https://doi.org/10.1109/VTEST.1998.670886