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Parallelism in structural fault testing of embedded cores.
- Source :
- Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231); 1998, p15-20, 6p
- Publication Year :
- 1998
Details
- Language :
- English
- ISBNs :
- 9780818684364
- Database :
- Complementary Index
- Journal :
- Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231)
- Publication Type :
- Conference
- Accession number :
- 92213378
- Full Text :
- https://doi.org/10.1109/VTEST.1998.670843