Statistical modeling of MOS transistors.

Authors :: Conti, M.
Crippa, P.
Orcioni, S.
Turchetti, C.
Source :: IWSM 1998 3rd International Workshop on Statistical Metrology (Cat No98EX113); 1998, p92-95, 4p
Publication Year :: 1998

Language :: English
ISBNs :: 9780780343382
Database :: Complementary Index
Journal :: IWSM 1998 3rd International Workshop on Statistical Metrology (Cat No98EX113)
Publication Type :: Conference
Accession number :: 92195939
Full Text :: https://doi.org/10.1109/IWSTM.1998.729778