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Wavelet analysis to fabric defects detection in weaving processes.
- Source :
- ISIE '99 Proceedings of the IEEE International Symposium on Industrial Electronics (Cat No99TH8465); 1999, Issue 3, p1406-1406, 1p
- Publication Year :
- 1999
Details
- Language :
- English
- ISBNs :
- 9780780356627
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- ISIE '99 Proceedings of the IEEE International Symposium on Industrial Electronics (Cat No99TH8465)
- Publication Type :
- Conference
- Accession number :
- 92195168
- Full Text :
- https://doi.org/10.1109/ISIE.1999.796918