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High level ATPG is important and is on its way!

Authors :
Kapur, R.
Source :
International Test Conference 1999 Proceedings (IEEE Cat No99CH37034); 1999, p1115-1116, 2p
Publication Year :
1999

Details

Language :
English
ISBNs :
9780780357532
Database :
Complementary Index
Journal :
International Test Conference 1999 Proceedings (IEEE Cat No99CH37034)
Publication Type :
Conference
Accession number :
92191412
Full Text :
https://doi.org/10.1109/TEST.1999.805850