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A new high temperature electrode-barrier technology on high density ferroelectric capacitor structure.

Authors :
Onishi, S.
Nagata, M.
Mitarai, S.
Ito, Y.
Kudo, J.
Sakiyama, K.
Desu, S.B.
Bhatt, H.D.
Vijay, D.P.
Hwang, Y.
Source :
International Electron Devices Meeting Technical Digest; 1996, p699-702, 4p
Publication Year :
1996

Details

Language :
English
ISBNs :
9780780333932
Database :
Complementary Index
Journal :
International Electron Devices Meeting Technical Digest
Publication Type :
Conference
Accession number :
92188446
Full Text :
https://doi.org/10.1109/IEDM.1996.554077