Assessment of quantum yield experiments via full band Monte Carlo simulations.

Details

Language :

English

ISBNs :

9780780341005

Database :

Complementary Index

Journal :

International Electron Devices Meeting IEDM Technical Digest

Publication Type :

Conference

Accession number :

92188272

Full Text :

https://doi.org/10.1109/IEDM.1997.650519