A high performance 180 nm generation logic technology.

Authors :: Yang, S.
Ahmed, S.
Arcot, B.
Arghavani, R.
Bai, P.
Chambers, S.
Charvat, P.
Cotner, R.
Gasser, R.
Ghani, T.
Hussein, M.
Jan, C.
Kardas, C.
Maiz, J.
McGregor, P.
McIntyre, B.
Nguyen, P.
Packan, P.
Post, I.
Sivakumar, S.
Source :: International Electron Devices Meeting 1998 Technical Digest (Cat No98CH36217); 1998, p197-200, 4p
Publication Year :: 1998

Language :: English
ISBNs :: 9780780347748
Database :: Complementary Index
Journal :: International Electron Devices Meeting 1998 Technical Digest (Cat No98CH36217)
Publication Type :: Conference
Accession number :: 92187874
Full Text :: https://doi.org/10.1109/IEDM.1998.746320