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Measurement of micrometer particles by means of induced charges.
- Source :
- Conference Record of the IEEE Industry Applications Society Annual Meeting; 1989, p2233-2233, 1p
- Publication Year :
- 1989
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- Conference Record of the IEEE Industry Applications Society Annual Meeting
- Publication Type :
- Conference
- Accession number :
- 92174230
- Full Text :
- https://doi.org/10.1109/IAS.1989.96950