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Analysis and measurement of chip current imbalances caused by the structure of bus bars in an IGBT module.
- Source :
- Conference Record of the 1999 IEEE Industry Applications Conference Thirty-Forth IAS Annual Meeting (Cat No99CH36370); 1999, Issue 3, p1775-1775, 1p
- Publication Year :
- 1999
Details
- Language :
- English
- ISBNs :
- 9780780355897
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Conference Record of the 1999 IEEE Industry Applications Conference Thirty-Forth IAS Annual Meeting (Cat No99CH36370)
- Publication Type :
- Conference
- Accession number :
- 92173772
- Full Text :
- https://doi.org/10.1109/IAS.1999.805980