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A comprehensive study of failure mode in IGBT applications due to freewheeling diode snappy recovery.
- Source :
- Conference Record of 1998 IEEE Industry Applications Conference Thirty-Third IAS Annual Meeting (Cat No98CH36242); 1998, Issue 2, p840-840, 1p
- Publication Year :
- 1998
Details
- Language :
- English
- ISBNs :
- 9780780349438
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Conference Record of 1998 IEEE Industry Applications Conference Thirty-Third IAS Annual Meeting (Cat No98CH36242)
- Publication Type :
- Conference
- Accession number :
- 92169351
- Full Text :
- https://doi.org/10.1109/IAS.1998.730243