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MMIC related metrology at the National Institute of Standards and Technology.
- Source :
- 7th IEEE Conference on Instrumentation & Measurement Technology; 1990, p196-199, 4p
- Publication Year :
- 1990
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- 7th IEEE Conference on Instrumentation & Measurement Technology
- Publication Type :
- Conference
- Accession number :
- 92152066
- Full Text :
- https://doi.org/10.1109/IMTC.1990.65997