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Automatic optical inspection (AOI).

Authors :
Hecht, O.
Dishon, G.
Source :
40th Conference Proceedings on Electronic Components & Technology; 1990, p659-659, 1p
Publication Year :
1990

Details

Language :
English
Database :
Complementary Index
Journal :
40th Conference Proceedings on Electronic Components & Technology
Publication Type :
Conference
Accession number :
92150057
Full Text :
https://doi.org/10.1109/ECTC.1990.122259
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