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Evaluation of Room Temperature Wafer Bonding by Fabrication of a GaAs/Pt/Si Metal Base Transistor.

Authors :
Dessein, K.
Nemeth, S.
Vlutters, R.
Delaey, L.
De Boeck, J.
Borghs, G.
Source :
29th European Solid-State Device Research Conference; 1999, Issue 1, p280-283, 4p
Publication Year :
1999

Details

Language :
English
ISBNs :
9782863322451
Issue :
1
Database :
Complementary Index
Journal :
29th European Solid-State Device Research Conference
Publication Type :
Conference
Accession number :
92145746

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