Characterization of emitting carbon films.

Authors :: Tolt, Z.L.
Fink, R.L.
Yaniv, Z.
Source :: 25th Anniversary, IEEE Conference Record - Abstracts 1998 IEEE International Conference on Plasma Science (Cat No98CH36221); 1998, p226-226, 1p
Publication Year :: 1998

Language :: English
ISBNs :: 9780780347922
Database :: Complementary Index
Journal :: 25th Anniversary, IEEE Conference Record - Abstracts 1998 IEEE International Conference on Plasma Science (Cat No98CH36221)
Publication Type :: Conference
Accession number :: 92143643
Full Text :: https://doi.org/10.1109/PLASMA.1998.677756