Performance and reliability of oxide confined VCSELs.

Authors :: Wipiejewski, T.
Wolf, H.D.
Korte, L.
Huber, W.
Kristen, G.
Hoyler, C.
Hedrich, H.
Kleinbub, O.
Popp, M.
Kaindl, J.
Rieger, A.
Albrecht, T.
Mueller, J.
Orth, A.
Spika, Z.
Lutgen, S.
Pflaeging, H.
Harrasser, J.
Source :: 1999 Proceedings 49th Electronic Components & Technology Conference (Cat No99CH36299); 1999, p741-746, 6p
Publication Year :: 1999

Language :: English
ISBNs :: 9780780352315
Database :: Complementary Index
Journal :: 1999 Proceedings 49th Electronic Components & Technology Conference (Cat No99CH36299)
Publication Type :: Conference
Accession number :: 92140017
Full Text :: https://doi.org/10.1109/ECTC.1999.776264