A methodology to assess the influence of Burn In related to long-term reliability of submicron CMOS transistors.

Details

Language :

English

ISBNs :

9780780356498

Database :

Complementary Index

Journal :

1999 IEEE International Integrated Reliability Workshop Final Report (Cat No 99TH8460)

Publication Type :

Conference

Accession number :

92135521

Full Text :

https://doi.org/10.1109/IRWS.1999.830550