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Testing for Year 2000 readiness-technical and management issues.

Authors :
Downing, W.D.
Hokanson, J.
Source :
1999 IEEE AUTOTESTCON Proceedings (Cat No99CH36323); 1999, p483-489, 7p
Publication Year :
1999

Details

Language :
English
ISBNs :
9780780354326
Database :
Complementary Index
Journal :
1999 IEEE AUTOTESTCON Proceedings (Cat No99CH36323)
Publication Type :
Conference
Accession number :
92133728
Full Text :
https://doi.org/10.1109/AUTEST.1999.800418