Circuit performance variability decomposition.

Authors :: Orshansky, M.
Spanos, C.
Chenming Hu
Source :: 1999 4th International Workshop on Statistical Metrology (Cat No99TH8391); 1999, p10-13, 4p
Publication Year :: 1999

Language :: English
ISBNs :: 9780780351547
Database :: Complementary Index
Journal :: 1999 4th International Workshop on Statistical Metrology (Cat No99TH8391)
Publication Type :: Conference
Accession number :: 92131359
Full Text :: https://doi.org/10.1109/IWSTM.1999.773184