Computer-aided analysis of surface-state effects on gate-lag phenomena in GaAs MESFETs.

Details

Language :

English

ISBNs :

9780780349001

Database :

Complementary Index

Journal :

1998 URSI International Symposium on Signals, Systems & Electronics Conference Proceedings (Cat No98EX167)

Publication Type :

Conference

Accession number :

92130591

Full Text :

https://doi.org/10.1109/ISSSE.1998.738111