Small angle glancing X-ray scattering for surface characterization of ion-implanted industrial materials.

Details

Language :

English

ISBNs :

9780780345386

Issue :

2

Database :

Complementary Index

Journal :

1998 International Conference on Ion Implantation Technology Proceedings (Cat No98EX144)

Publication Type :

Conference

Accession number :

92129150

Full Text :

https://doi.org/10.1109/IIT.1998.813879