Analyzing shielded connectors using feature transfer impedance.

Authors :: Dunwoody, S.
Nadolny, J.
Kelly, K.
Source :: 1998 IEEE EMC Symposium International Symposium on Electromagnetic Compatibility Symposium Record (Cat No98CH36253); 1998, Issue 1, p480-480, 1p
Publication Year :: 1998

Language :: English
ISBNs :: 9780780350151
Issue :: 1
Database :: Complementary Index
Journal :: 1998 IEEE EMC Symposium International Symposium on Electromagnetic Compatibility Symposium Record (Cat No98CH36253)
Publication Type :: Conference
Accession number :: 92125059
Full Text :: https://doi.org/10.1109/ISEMC.1998.750140