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Reliability of Al/Ti gate AlGaAs/GaAs power HFETs in hydrogen gas.
- Source :
- 1998 GaAs Reliability Workshop Proceedings (Cat No98EX219); 1998, p75-81, 7p
- Publication Year :
- 1998
Details
- Language :
- English
- ISBNs :
- 9780790800653
- Database :
- Complementary Index
- Journal :
- 1998 GaAs Reliability Workshop Proceedings (Cat No98EX219)
- Publication Type :
- Conference
- Accession number :
- 92124519
- Full Text :
- https://doi.org/10.1109/GAASRW.1998.768040