Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs].

MLA

Simons, M., et al. “Common-Source TLD and RADFET Characterization of Co-60, Cs-137, and X-Ray Irradiation Sources [Bipolar Linear ICs].” 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997 Workshop Record Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference, Jan. 1997, pp. 28–34. EBSCOhost, https://doi.org/10.1109/REDW.1997.629793.

APA

Simons, M., Pease, R. L., Fleetwood, D. M., Schwank, J. R., Krzesniak, M. F., Turflinger, T. L., Buaron, J., Riewe, L. C., Kemp, W. T., Duggan, P. W. C., Johnston, A. H., Wiedeman, M. C., Mills, R. E., Holmes-Siedle, A. G., Cohn, L. M., Doane, H. J., & Lohmeier, W. L. (1997). Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs]. 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997 Workshop Record Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference, 28–34. https://doi.org/10.1109/REDW.1997.629793

Chicago

Simons, M., R.L. Pease, D.M. Fleetwood, J.R. Schwank, M.F. Krzesniak, T.L. Turflinger, J. Buaron, et al. 1997. “Common-Source TLD and RADFET Characterization of Co-60, Cs-137, and X-Ray Irradiation Sources [Bipolar Linear ICs].” 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997 Workshop Record Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference, January, 28–34. doi:10.1109/REDW.1997.629793.