Correlations between initial via resistance and reliability performance.

Authors :: Graas, C.D.
Le, H.A.
Rosi, T.A.
Source :: 1997 IEEE International Reliability Physics Symposium Proceedings 35th Annual; 1997, p44-48, 5p
Publication Year :: 1997

Language :: English
ISBNs :: 9780780335752
Database :: Complementary Index
Journal :: 1997 IEEE International Reliability Physics Symposium Proceedings 35th Annual
Publication Type :: Conference
Accession number :: 92119376
Full Text :: https://doi.org/10.1109/RELPHY.1997.584233