Impact of the reduction of the gate to drain capacitance on low voltage operated CMOS devices.

Details

Language :

English

ISBNs :

9780780326026

Database :

Complementary Index

Journal :

1995 Symposium on VLSI Technology Digest of Technical Papers

Publication Type :

Conference

Accession number :

92108054

Full Text :

https://doi.org/10.1109/VLSIT.1995.520862