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Thermal analysis and modelling of a copper-polyimide thin-film-on-silicon multichip module packaging technology.

Authors :
Snyder, D.W.
Source :
1992 Proceedings Eighth Annual IEEE Semiconductor Thermal Measurement & Management Symposium; 1992, p101-109, 9p
Publication Year :
1992

Details

Language :
English
ISBNs :
9780780305007
Database :
Complementary Index
Journal :
1992 Proceedings Eighth Annual IEEE Semiconductor Thermal Measurement & Management Symposium
Publication Type :
Conference
Accession number :
92087573
Full Text :
https://doi.org/10.1109/STHERM.1992.172857