Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme.

Details

Language :

English

ISBNs :

9780818691560

Database :

Complementary Index

Journal :

1991, Proceedings International Test Conference

Publication Type :

Conference

Accession number :

92078989

Full Text :

https://doi.org/10.1109/TEST.1991.519716