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Physical analysis of electromigration damage under bidirectional (BC) and pulsed DC (PDC) conditions.

Authors :
Castano, E.
Maiz, J.
Source :
1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference; 1991, p258-264, 7p
Publication Year :
1991

Details

Language :
English
ISBNs :
9780879426736
Database :
Complementary Index
Journal :
1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference
Publication Type :
Conference
Accession number :
92074615
Full Text :
https://doi.org/10.1109/VMIC.1991.152997
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