A novel method to characterize and screen mobile ion contaminated nonvolatile memory products.

Details

Language :

English

ISBNs :

9780780300361

Database :

Complementary Index

Journal :

1991 International Symposium on VLSI Technology, Systems & Applications - Proceedings of Technical Papers

Publication Type :

Conference

Accession number :

92072861

Full Text :

https://doi.org/10.1109/VTSA.1991.246677