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SD3: An Efficient Dynamic Data-Dependence Profiling Mechanism.

Authors :
Kim, Minjang
Lakshminarayana, Nagesh B.
Kim, Hyesoon
Luk, Chi-Keung
Source :
IEEE Transactions on Computers; Dec2013, Vol. 62 Issue 12, p2516-2530, 15p
Publication Year :
2013

Abstract

As multicore processors are deployed in mainstream computing, the need for software tools to help parallelize programs is increasing dramatically. Data-dependence profiling is an important program analysis technique to exploit parallelism in serial programs. More specifically, manual, semiautomatic, or automatic parallelization can use the outcomes of data-dependence profiling to guide where and how to parallelize in a program. However, state-of-the-art data-dependence profiling techniques consume extremely huge resources as they suffer from two major issues when profiling large and long-running applications: 1) runtime overhead and 2) memory overhead. Existing data-dependence profilers are either unable to profile large-scale applications with a typical resource budget or only report very limited information. In this paper, we propose an efficient approach to data-dependence profiling that can address both runtime and memory overhead in a single framework. Our technique, called SD$({}^3)$, reduces the runtime overhead by parallelizing the dependence profiling step itself. To reduce the memory overhead, we compress memory accesses that exhibit stride patterns and compute data dependences directly in a compressed format. We demonstrate that SD$({}^3)$ reduces the runtime overhead when profiling SPEC 2006 by a factor of 4.1× and 9.7× on eight cores and 32 cores, respectively. For the memory overhead, we successfully profile 22 SPEC 2006 benchmarks with the reference input, while the previous approaches fail even with the train input. In some cases, we observe more than a 20× improvement in memory consumption and a 16× speedup in profiling time when 32 cores are used. We also demonstrate the usefulness of SD$({}^3)$ by showing manual parallelization followed by data dependence profiling results. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189340
Volume :
62
Issue :
12
Database :
Complementary Index
Journal :
IEEE Transactions on Computers
Publication Type :
Academic Journal
Accession number :
91820580
Full Text :
https://doi.org/10.1109/TC.2012.182