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Application of AFM in microscopy and fabrication of micro/nanostructures.

Authors :
Lopour, F.
Kalousek, R.
Škoda, D.
Spousta, J.
Matějka, F.
Šikola, T.
Source :
Surface & Interface Analysis: SIA; 2002, Vol. 34 Issue 1, p352-355, 4p
Publication Year :
2002

Details

Language :
English
ISSN :
01422421
Volume :
34
Issue :
1
Database :
Complementary Index
Journal :
Surface & Interface Analysis: SIA
Publication Type :
Academic Journal
Accession number :
90818309
Full Text :
https://doi.org/10.1002/sia.1315