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Application of parallel factor analysis and x-ray photoelectron spectroscopy to the initial stages in oxidation of aluminium. I. The Al 2p photoelectron line.

Authors :
Do, T.
McIntyre, N. S.
Harshman, R. A.
Lundy, M. E.
Splinter, S. J.
Source :
Surface & Interface Analysis: SIA; 1999, Vol. 27 Issue 7, p618-628, 11p
Publication Year :
1999

Details

Language :
English
ISSN :
01422421
Volume :
27
Issue :
7
Database :
Complementary Index
Journal :
Surface & Interface Analysis: SIA
Publication Type :
Academic Journal
Accession number :
90817545
Full Text :
https://doi.org/10.1002/(SICI)1096-9918(199907)27:7<618::AID-SIA550>3.0.CO;2-7