Electron beam effects during analysis of glass thin films with auger electron spectroscopy.

Details

Language :

English

ISSN :

01422421

Volume :

2

Issue :

3

Database :

Complementary Index

Journal :

Surface & Interface Analysis: SIA

Publication Type :

Academic Journal

Accession number :

90814302

Full Text :

https://doi.org/10.1002/sia.740020303