Back to Search
Start Over
Energy levels of dislocations in Ge under different conditions. Comparison between images of electron- and light-beam scanning microscopy.
- Source :
- Kristall & Technik; 1981, Vol. 16 Issue 2, p163-168, 6p
- Publication Year :
- 1981
Details
- Language :
- English
- ISSN :
- 00234753
- Volume :
- 16
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Kristall & Technik
- Publication Type :
- Academic Journal
- Accession number :
- 90684508
- Full Text :
- https://doi.org/10.1002/crat.19810160208