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Characterizing the Effects of Single Event Upsets on Synchronous Data Paths.

Authors :
Berg, Melanie
Friendlich, Mark
Kim, Hak
Seidlick, Christina
LaBel, Kenneth
Ladbury, Ray
Pellish, Jonathan
Source :
IEEE Transactions on Nuclear Science; Jul2013 Part 1, Vol. 60 Issue 4, p2697-2703, 7p
Publication Year :
2013

Abstract

We present a Single Event Upset (SEU) model with supporting data demonstrating frequency effects that deviate from conventional theory. The model emphasizes design topology versus circuit-element contributions to SEU cross sections. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
SINGLE event effects
TOPOLOGY
NUCLEAR cross sections
ENGINEERING design
DEVIATION (Statistics)

Details

Language :
English
ISSN :
00189499
Volume :
60
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
89803237
Full Text :
https://doi.org/10.1109/TNS.2013.2273938
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