Short-circuit tests on SiC power MOSFETs.

Authors :: Castellazzi, Alberto
Funaki, Tsuyoshi
Kimoto, Tsunenobu
Hikihara, Takashi
Source :: 2013 IEEE 10th International Conference on Power Electronics & Drive Systems (PEDS); 2013, p1297-1300, 4p
Publication Year :: 2013

Language :: English
ISBNs :: 9781467317900
Database :: Complementary Index
Journal :: 2013 IEEE 10th International Conference on Power Electronics & Drive Systems (PEDS)
Publication Type :: Conference
Accession number :: 89503736
Full Text :: https://doi.org/10.1109/PEDS.2013.6527219