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Wireless wafer probing for on-chip analog voltage measurement.

Wireless wafer probing for on-chip analog voltage measurement.

Authors :
Lee, Dae Young
Wentzloff, David D.
Hayes, John P.
Source :
2012 10th International Power & Energy Conference (IPEC); 2012, p325-328, 4p
Publication Year :
2012

Details

Language :
English
ISBNs :
9781467345828
Database :
Complementary Index
Journal :
2012 10th International Power & Energy Conference (IPEC)
Publication Type :
Conference
Accession number :
89501815
Full Text :
https://doi.org/10.1109/IPEC.2012.6522691