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Systematic Patterns in T² Charts.

Authors :
Mason, Robert L.
Youn-Min Chou
Sullivan, Joe H.
Stoumbos, Zachary G.
Young, John C.
Source :
Journal of Quality Technology; Jan2003, Vol. 35 Issue 1, p47, 12p, 1 Chart, 24 Graphs
Publication Year :
2003

Abstract

Examines the process conditions that lead to the occurrence of nonrandom patterns in a T² control chart. Application of the T² statistic in a phase I operation; Cyclic pattern in T² Trend patterns in T² charts.

Details

Language :
English
ISSN :
00224065
Volume :
35
Issue :
1
Database :
Complementary Index
Journal :
Journal of Quality Technology
Publication Type :
Academic Journal
Accession number :
8865509
Full Text :
https://doi.org/10.1080/00224065.2003.11980190