Back to Search Start Over

Wide Frequency Band Characterization.

Authors :
Balestra, Francis
Source :
Nanoscale CMOS: Innovative Materials, Modeling & Characterization; 2013, p603-638, 36p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781848211803
Database :
Complementary Index
Journal :
Nanoscale CMOS: Innovative Materials, Modeling & Characterization
Publication Type :
Book
Accession number :
88204550
Full Text :
https://doi.org/10.1002/9781118621523.ch17